The first example consists of three sections, all of them displayed in Figure . From left to right we have a flat-layer, a dipping layer, and a dipping layer. All the sections consist of, from top to bottom, a single shot gather, an image from one shot gather, an angle-domain common-image gather obtained with the conventional methodology, and the angle-domain common-image gather obtained with the proposed methodology. The data space consists of only one shot gather; therefore, the representation in an ADCIG should have non-zero energy for only one angle. Table 1 shows the survey details and the computed angle values for this experiment. In both angle-domain gathers, the solid line corresponds to the expected angle value; as expected the angle gathers obtained with the proposed methodology perfectly match the values in the table.
Our second experiment is also a single-shot experiment. The intention of this exercise is to present the separation of the full-aperture angle () into its P-incidence (), and its S-reflection () components. Figure shows, from top to bottom, the flat-layer case, a dipping layer case, and a dipping layer case for this experiment. Each case consists of, from left to right, the image of a single-shot gather; the corresponding angle-domain common-image gather, which is taken at the location marked in the image; the corresponding P-angle-domain common-image gather; and the corresponding S-angle-domain common-image gather. Table 2 shows the corresponding values for this experiment. The solid lines in each of the angle-gathers represent the computed value in table 2.
These two synthetic examples clearly show that the proposed methodology accurately transforms SODCIGs into ADCIGs for the converted-mode case. Moreover, we are able to compute the specific incidence and reflection angles.