The first example consists of three sections, all of
them displayed in Figure . From
left to right we have a flat-layer, a
dipping layer, and a
dipping
layer. All the sections consist of, from
top to bottom, a single shot gather, an image
from one shot gather, an angle-domain common-image
gather obtained with the conventional methodology, and
the angle-domain common-image gather obtained with
the proposed methodology. The data space consists
of only one shot gather; therefore, the representation
in an ADCIG should have non-zero energy for only one angle.
Table 1 shows the
survey details and the computed angle values
for this experiment. In both angle-domain gathers, the solid
line corresponds to the expected angle value; as expected
the angle gathers obtained with the proposed methodology
perfectly match the values in the table.
![]() |
Refl. dip | Shot-loc. | CIG-Loc | ![]() |
Flat layer | 500 | 2000 | ![]() |
![]() |
500 | 1750 | ![]() |
![]() |
500 | 1000 | ![]() |
Our second experiment is also a single-shot experiment.
The intention of this exercise is to present the separation
of the full-aperture angle () into its P-incidence
(
), and its S-reflection (
) components.
Figure
shows,
from top to bottom, the flat-layer case,
a
dipping layer case, and a
dipping
layer case for this experiment. Each case consists of, from left to right,
the image of a single-shot gather; the corresponding
angle-domain common-image gather, which is taken at the
location marked in the image; the corresponding P-angle-domain
common-image gather; and the corresponding S-angle-domain
common-image gather. Table 2 shows the
corresponding values for this experiment.
The solid lines in each of the angle-gathers
represent the computed value in table 2.
![]() |
Refl. dip | Shot-loc. | CIG-Loc. | P-angle | S-angle |
Flat layer | 500 | 1000 | ![]() |
![]() |
![]() |
500 | 1500 | ![]() |
![]() |
![]() |
500 | 1000 | ![]() |
![]() |
These two synthetic examples clearly show that the proposed methodology accurately transforms SODCIGs into ADCIGs for the converted-mode case. Moreover, we are able to compute the specific incidence and reflection angles.